SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007 - Beijing, China (Sunday 9 September 2007)] International Symposium on Photoelectronic Detection and Imaging 2007: Related Technologies and Applications - Real-time surface defects inspection of steel strip based on difference image
Cong, Jia-hui, Yan, Yun-hui, Zhang, Hai-an, Li, Jun, Zhou, LiweiVolume:
6625
Year:
2008
Language:
english
DOI:
10.1117/12.790865
File:
PDF, 508 KB
english, 2008