Kelvin probe measurements of microcrystalline silicon on a...

Solar Energy Materials and Solar Cells 2001 Vol. 66; Iss. 1-4

Kelvin probe measurements of microcrystalline silicon on a nanometer scale using SFM

A Breymesser, V Schlosser, D Peiró, C Voz, J Bertomeu, J Andreu, J Summhammer
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Volume:
66
Year:
2001
Language:
english
Pages:
7
DOI:
10.1016/s0927-0248(00)00170-7
File:
PDF, 299 KB
english, 2001
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