Improved photovoltaic method for measurement of minority carrier diffusion length applied to silicon solar cells
J. Toušek, D. Kindl, J. Toušková, S. DolhovVolume:
69
Year:
2001
Language:
english
Pages:
6
DOI:
10.1016/s0927-0248(01)00057-5
File:
PDF, 146 KB
english, 2001