Utilisation of a micro-tip scanning Kelvin probe for...

Solar Energy Materials and Solar Cells 2003 Vol. 79; Iss. 4

Utilisation of a micro-tip scanning Kelvin probe for non-invasive surface potential mapping of mc-Si solar cells

Konrad Dirscherl, Iain Baikie, Gregor Forsyth, Arvid van der Heide
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Volume:
79
Year:
2003
Language:
english
Pages:
10
DOI:
10.1016/s0927-0248(03)00064-3
File:
PDF, 651 KB
english, 2003
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