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EELS microanalysis of polycrystalline silicon thin films for solar cells grown at low temperatures
Michael Stöger, Michael Nelhiebel, Peter Schattschneider, Viktor Schlosser, Alexander Breymesser, Bernard JouffreyVolume:
63
Year:
2000
Language:
english
Pages:
8
DOI:
10.1016/s0927-0248(99)00172-5
File:
PDF, 238 KB
english, 2000