Solid-material-based coupling efficiency analyzed with time-of-flight secondary ion mass spectrometry
Muenster, Bastian, Welle, Alexander, Ridder, Barbara, Althuon, Daniela, Striffler, Jakob, Foertsch, Tobias C., Hahn, Lothar, Thelen, Richard, Stadler, Volker, Nesterov-Mueller, Alexander, Breitling, FVolume:
360
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2015.10.223
Date:
January, 2016
File:
PDF, 2.30 MB
english, 2016