Modeling of X-ray excited luminescence intensity dependence...

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Radiation Measurements 2015 / 12

Modeling of X-ray excited luminescence intensity dependence on the nanoparticle size

Vistovskyy, V., Chornodolskyy, Ya., Gloskovskii, A., Syrotyuk, S., Malyi, T., Chylii, M., Zhmurin, P., Gektin, A., Vasil’ev, A., Voloshinovskii, A.
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Language:
english
Journal:
Radiation Measurements
DOI:
10.1016/j.radmeas.2015.12.010
Date:
December, 2015
File:
PDF, 468 KB
english, 2015
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