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[IEEE 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Singapore, Singapore (2015.6.1-2015.6.4)] 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Supply-variation-resilient nonvolatile 3D IC and 3D memory using low peak-current on-chip charge-pump circuits
Chang, Meng-Fan, Lu, Wang-Ying, Shen, Shin-Jang, Chen, Ming-Pin, Lin, Chih-Sheng, Sheu, S.-S., Hung, C.-H., Yang, Y.-S., Kuo, Y.-J., Hung, S.-N., Lue, H.-T., Shen, Chang-Hong, Shieh, Jia-MinYear:
2015
DOI:
10.1109/EDSSC.2015.7285064
File:
PDF, 1005 KB
2015