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SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Soft X-Ray Lasers and Applications II - Transient inversion XUV-lasers in Ti and Ge
Nickles, Peter V., Schnuerer, Matthias, Kalachnikov, Mikhail P., Sandner, Wolfgang, Shlyaptsev, Vyacheslav N., Danson, Colin N., Neely, David, Wolfrum, E., Zhang, Jie, Behjat, A., Demir, A., Tallents,Volume:
3156
Year:
1997
Language:
english
DOI:
10.1117/12.279405
File:
PDF, 245 KB
english, 1997