SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] X-Ray Mirrors, Crystals, and Multilayers II - EUV multilayer mirrors with tailored spectral reflectivity
Kuhlmann, Thomas, Yulin, Sergey A., Feigl, Torsten, Kaiser, Norbert, Freund, Andreas K., Macrander, Albert T., Ishikawa, Tetsuya, Wood, James L.Volume:
4782
Year:
2002
Language:
english
DOI:
10.1117/12.451348
File:
PDF, 247 KB
english, 2002