Electron microscopy characterization of Ba(Cd1/3Ta2/3)O3...

Journal of Materials Research 2004 / 5 Vol. 19; Iss. 5

Electron microscopy characterization of Ba(Cd1/3Ta2/3)O3 microwave dielectrics with boron additive

Sun, J., Liu, Shaojun, Newman, N., McCartney, M.R., Smith, David. J.
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Volume:
19
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/JMR.2004.0185
Date:
May, 2004
File:
PDF, 656 KB
english, 2004
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