[IEEE 2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) - Suzhou, China (2015.7.1-2015.7.3)] 2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) - Closed-form expressions for the capacitance of tapered through-silicon vias
Su, Jinrong, Zhang, WenmeiYear:
2015
Language:
english
DOI:
10.1109/IMWS-AMP.2015.7325022
File:
PDF, 297 KB
english, 2015