[IEEE MILCOM 2015 - 2015 IEEE Military Communications Conference - Tampa, FL, USA (2015.10.26-2015.10.28)] MILCOM 2015 - 2015 IEEE Military Communications Conference - Dimensional reduction analysis for Physical Layer device fingerprints with application to ZigBee and Z-Wave devices
Bihl, Trevor J., Bauer, Kenneth W., Temple, Michael A., Ramsey, BenjaminYear:
2015
Language:
english
DOI:
10.1109/MILCOM.2015.7357469
File:
PDF, 553 KB
english, 2015