Trapping levels in (nc-Si/CaF2)n multi-quantum wells

Materials Science and Engineering: C 2001 Vol. 15; Iss. 1-2

Trapping levels in (nc-Si/CaF2)n multi-quantum wells

V. Ioannou-Sougleridis, A.G. Nassiopoulou, M.L. Ciurea, F. Bassani, F. Arnaud d'Avitaya
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Volume:
15
Year:
2001
Language:
english
Pages:
3
DOI:
10.1016/s0928-4931(01)00215-6
File:
PDF, 80 KB
english, 2001
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