Measurement systems based on metal/dielectric...

Materials Science and Engineering: C 2002 Vol. 19; Iss. 1-2

Measurement systems based on metal/dielectric nanostructures for electrochemical analyses

Irina Kleps, Anca Angelescu, Mihaela Miu
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Volume:
19
Year:
2002
Language:
english
Pages:
5
DOI:
10.1016/s0928-4931(01)00469-6
File:
PDF, 368 KB
english, 2002
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