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Defect analysis of sputter grown cupric oxide for optical and electronics application
Dalapati, Goutam Kumar, Kajen, Rasanayagam Sivasayan, Masudy-Panah, Saeid, Sonar, PrashantVolume:
48
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/48/49/495104
Date:
December, 2015
File:
PDF, 1.13 MB
english, 2015