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[IEEE ESSDERC 2015 - 45th European Solid-State Device Research Conference - Graz, Austria (2015.9.14-2015.9.18)] 2015 45th European Solid State Device Research Conference (ESSDERC) - On the fly characterization of charge trapping phenomena at GaN/dielectric and GaN/AlGaN/dielectric interfaces using impedance measurements
Stradiotto, Roberta, Pobegen, Gregor, Ostermaier, Clemens, Grasser, TiborYear:
2015
Language:
english
DOI:
10.1109/ESSDERC.2015.7324716
File:
PDF, 1.06 MB
english, 2015