[IEEE ESSDERC 2015 - 45th European Solid-State Device...

  • Main
  • [IEEE ESSDERC 2015 - 45th European...

[IEEE ESSDERC 2015 - 45th European Solid-State Device Research Conference - Graz, Austria (2015.9.14-2015.9.18)] 2015 45th European Solid State Device Research Conference (ESSDERC) - On the fly characterization of charge trapping phenomena at GaN/dielectric and GaN/AlGaN/dielectric interfaces using impedance measurements

Stradiotto, Roberta, Pobegen, Gregor, Ostermaier, Clemens, Grasser, Tibor
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2015
Language:
english
DOI:
10.1109/ESSDERC.2015.7324716
File:
PDF, 1.06 MB
english, 2015
Conversion to is in progress
Conversion to is failed