[IEEE 2015 European Microwave Conference (EuMC 2015) - Paris, France (2015.9.7-2015.9.10)] 2015 European Microwave Conference (EuMC) - New 3D-TRL structures for on-wafer calibration For high frequency S-parameter measurement
Manuel, Potereau, Fregonese, Sebastien, Curutchet, Arnaud, Baureis, Peter, Zimmer, ThomasYear:
2015
Language:
english
DOI:
10.1109/EuMC.2015.7345726
File:
PDF, 1.10 MB
english, 2015