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SPIE Proceedings [SPIE The International Conference on Micro- and Nano-Electronics 2014 - Zvenigorod, Russian Federation (Monday 6 October 2014)] International Conference on Micro- and Nano-Electronics 2014 - Electrochemical recovery of damaged bonding area during failure analysis of the modern integrated circuits
Orlikovsky, Alexander A., Zubov, D. N., Kelm, E. A., Milovanov, R. A., Molodtsova, G.Volume:
9440
Year:
2014
Language:
english
DOI:
10.1117/12.2181191
File:
PDF, 13.36 MB
english, 2014