SPIE Proceedings [SPIE 20th Annual Technical Symposium -...

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SPIE Proceedings [SPIE 20th Annual Technical Symposium - San Diego (Monday 23 August 1976)] Laser Scanning Components and Techniques: Design Considerations/Trends - Market Outlook For Laser Scanners In Information Handling

Eward, Ronald S., Beiser, Leo, Marshall, Gerald F.
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Volume:
84
Year:
1977
Language:
english
DOI:
10.1117/12.954912
File:
PDF, 330 KB
english, 1977
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