Availability of systems with self-diagnostic components—applying Markov model to IEC 61508-6
Tieling Zhang, Wei Long, Yoshinobu SatoVolume:
80
Year:
2003
Language:
english
Pages:
9
DOI:
10.1016/s0951-8320(03)00004-8
File:
PDF, 183 KB
english, 2003