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[IEEE 2015 6th Asia Symposium on Quality Electronic Design (ASQED) - Kula Lumpur, Malaysia (2015.8.4-2015.8.5)] 2015 6th Asia Symposium on Quality Electronic Design (ASQED) - Optimizing test time for core-based 3-D integrated circuits by genetic algorithm
Kaibartta, Tanusree, Giri, Chandan, Rahaman, Hafizur, Das, Debesh K.Year:
2015
Language:
english
DOI:
10.1109/ACQED.2015.7274008
File:
PDF, 311 KB
english, 2015