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[IEEE 2012 IEEE/IFIP 20th International Conference on VLSI and System-on-Chip (VLSI-SoC) - Santa Cruz, CA, USA (2012.10.7-2012.10.10)] 2012 IEEE/IFIP 20th International Conference on VLSI and System-on-Chip (VLSI-SoC) - On the optimized generation of Software-Based Self-Test programs for VLIW processors
Sabena, D., Reorda, M. Sonza, Sterpone, L.Year:
2012
Language:
english
DOI:
10.1109/VLSI-SoC.2012.7332089
File:
PDF, 714 KB
english, 2012