SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Electro-Optical System Design, Simulation, Testing, and Training - Optimization of multiple-source illumination for machine vision inspection via visual simulation
Wasserman, Richard M., Silber, Andrew D., Wasserman, Richard M., DeVore, Scott L.Volume:
4772
Year:
2002
Language:
english
DOI:
10.1117/12.455996
File:
PDF, 470 KB
english, 2002