Optimal burn-in procedure for mixed populations based on the device degradation process history
Cha, Ji Hwan, Pulcini, GianpaoloLanguage:
english
Journal:
European Journal of Operational Research
DOI:
10.1016/j.ejor.2015.12.019
Date:
December, 2015
File:
PDF, 1.94 MB
english, 2015