Optimal burn-in procedure for mixed populations based on...

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Optimal burn-in procedure for mixed populations based on the device degradation process history

Cha, Ji Hwan, Pulcini, Gianpaolo
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Language:
english
Journal:
European Journal of Operational Research
DOI:
10.1016/j.ejor.2015.12.019
Date:
December, 2015
File:
PDF, 1.94 MB
english, 2015
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