[IEEE 2015 33rd IEEE International Conference on Computer...

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[IEEE 2015 33rd IEEE International Conference on Computer Design (ICCD) - New York City, NY, USA (2015.10.18-2015.10.21)] 2015 33rd IEEE International Conference on Computer Design (ICCD) - Reliable and high performance STT-MRAM architectures based on controllable-polarity devices

Shamsi, Kaveh, Bi, Yu, Jin, Yier, Gaillardon, Pierre-Emmanuel, Niemier, Michael, Hu, X. Sharon
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Year:
2015
Language:
english
DOI:
10.1109/ICCD.2015.7357123
File:
PDF, 242 KB
english, 2015
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