How the trapping of charges can explain the dielectric breakdown performance of alumina ceramics
J. Liebault, J. Vallayer, D. Goeuriot, D. Treheux, F. ThevenotVolume:
21
Year:
2001
Language:
english
Pages:
9
DOI:
10.1016/s0955-2219(00)00186-2
File:
PDF, 621 KB
english, 2001