Dielectric properties of Bi2(Zn1/3Nb2/3)2O7 thin films...

Dielectric properties of Bi2(Zn1/3Nb2/3)2O7 thin films measured by Fourier transform infrared spectroscopy

Yi-Chun Chen, Hsiang-Lin Liu, Hsiu-Fung Cheng, I.-Nan Lin
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Volume:
21
Year:
2001
Language:
english
Pages:
4
DOI:
10.1016/s0955-2219(01)00099-1
File:
PDF, 125 KB
english, 2001
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