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Micromechanisms of creep-fatigue crack growth in α′-β′-SiAlON at 1200 °C
Guo-Dong Zhan, Jian-Lin Shi, Ting-Rong Lai, Tung-Sheng YenVolume:
17
Year:
1997
Language:
english
Pages:
10
DOI:
10.1016/s0955-2219(96)00232-4
File:
PDF, 1.36 MB
english, 1997