Evaluation of field emission properties from...

Thin Solid Films 2015 / 11

Evaluation of field emission properties from multiple-stacked Si quantum dots

Takeuchi, Daichi, Makihara, Katsunori, Ohta, Akio, Ikeda, Mitsuhisa, Miyazaki, Seiichi
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Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2015.10.070
Date:
November, 2015
File:
PDF, 993 KB
english, 2015
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