![](/img/cover-not-exists.png)
[IEEE 2014 32nd IEEE International Conference on Computer Design (ICCD) - Seoul, South Korea (2014.10.19-2014.10.22)] 2014 IEEE 32nd International Conference on Computer Design (ICCD) - Exploit asymmetric error rates of cell states to improve the performance of flash memory storage systems
Gao, Congming, Shi, Liang, Wu, Kaijie, Xue, Chun Jason, Sha, Edwin H.-M.Year:
2014
Language:
english
DOI:
10.1109/ICCD.2014.6974682
File:
PDF, 2.89 MB
english, 2014