SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XV - Reasons of low charge collection efficiency in CdTe-based x/γ detectors with ohmic contacts
Aoki, Toru, Maslyanchuk, O. L., Kosyachenko, L. A., Gnatyuk, V. A., Fiederle, Michael, Burger, Arnold, Franks, Larry, James, Ralph B.Volume:
8852
Year:
2013
Language:
english
DOI:
10.1117/12.2022657
File:
PDF, 399 KB
english, 2013