SPIE Proceedings [SPIE SPIE's 9th Annual International Symposium on Smart Structures and Materials - San Diego, CA (Sunday 17 March 2002)] Smart Structures and Materials 2002: Smart Structures and Integrated Systems - Structural integrity monitoring of composite patch repairs using wavelet analysis and neural networks
Amaravadi, Venkata K., Mitchell, Kyle, Rao, Vittal S., Derriso, Mark M., Davis, L. PorterVolume:
4701
Year:
2002
Language:
english
DOI:
10.1117/12.474655
File:
PDF, 415 KB
english, 2002