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[IEEE 2015 4th International Conference on Reliability, Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions) - Noida, India (2015.9.2-2015.9.4)] 2015 4th International Conference on Reliability, Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions) - Computer forensic tool using history and feedback approach
Jain, Nilakshi, Kalbande, Dhananjay RYear:
2015
Language:
english
DOI:
10.1109/ICRITO.2015.7359315
File:
PDF, 250 KB
english, 2015