[IEEE 2015 IEEE 21st International On-Line Testing Symposium (IOLTS) - Halkidiki, Greece (2015.7.6-2015.7.8)] 2015 IEEE 21st International On-Line Testing Symposium (IOLTS) - Optimization of SEU emulation on SRAM FPGAs based on sensitiveness analysis
Souari, Anis, Thibeault, Claude, Blaquiere, Yves, Velazco, RaoulYear:
2015
DOI:
10.1109/IOLTS.2015.7229827
File:
PDF, 133 KB
2015