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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Research and development of AOTF based NIR spectrometer
Zhang, Hui, Li, ShuJun, Bao, ManYu, Wen, Qi, Wang, WeiPing, Yan, HongFeng, Zhang, XiaoChao, Wang, Zhi, Wang, RuiJun, Yang, Li, Namba, Yoshiharu, Walker, David D., Li, ShengyiVolume:
7655
Year:
2010
Language:
english
DOI:
10.1117/12.866648
File:
PDF, 378 KB
english, 2010