AIP Conference Proceedings [AIP XXII INTERNATIONAL CONFERENCE ON RAMAN SPECTROSCOPY - Boston (MA) (8–10 August 2010)] - Combining Atomic Force Microscopy with Polarized Raman Microscopy
Sawatzki, Juergen, Wehlack, Carsten, Possart, Wulff, Thoene, Andrea, Hannss, Matthias, Schlipper, Ralph, Rider, Tim, Champion, P. M., Ziegler, L. D.Year:
2010
Language:
english
DOI:
10.1063/1.3482820
File:
PDF, 1.56 MB
english, 2010