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Direct analytical method of contact position effects on the energy-level alignments at organic semiconductor/electrode interfaces using photoemission spectroscopy combined with Ar gas cluster ion beam sputtering
Yun, Dong-Jin, Chung, JaeGwan, Heon Kim, Seong, Kim, Yongsu, Park, SungHoon, Seol, Minsu, Heo, SungVolume:
26
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/26/46/465704
Date:
November, 2015
File:
PDF, 4.57 MB
english, 2015