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SPIE Proceedings [SPIE Electronic Imaging: Science & Technology - San Jose, CA (Sunday 28 January 1996)] Visual Data Exploration and Analysis III - Building assessment with subpixel accuracy using satellite imagery
Meng, Julian, Davenport, Michael, Grinstein, Georges G., Erbacher, Robert F.Volume:
2656
Year:
1996
Language:
english
DOI:
10.1117/12.234692
File:
PDF, 851 KB
english, 1996