[IEEE 2015 IEEE Custom Integrated Circuits Conference - CICC 2015 - San Jose, CA, USA (2015.9.28-2015.9.30)] 2015 IEEE Custom Integrated Circuits Conference (CICC) - Scaling challenges of FinFET technology at advanced nodes and its impact on SoC design (Invited)
Banna, SrinivasaYear:
2015
Language:
english
DOI:
10.1109/CICC.2015.7338378
File:
PDF, 1.50 MB
english, 2015