SPIE Proceedings [SPIE Scanning Microscopy 2010 - Monterey, California (Monday 17 May 2010)] Scanning Microscopy 2010 - Investigation of gunshot residue patterns using milli-XRF-techniques: first experiences in casework
Schumacher, Rüdiger, Barth, Martin, Neimke, Dieter, Niewöhner, Ludwig, Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Joy, David C.Volume:
7729
Year:
2010
Language:
english
DOI:
10.1117/12.853852
File:
PDF, 23.30 MB
english, 2010