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[IEEE 2015 IEEE International Conference on Image Processing (ICIP) - Quebec City, QC, Canada (2015.9.27-2015.9.30)] 2015 IEEE International Conference on Image Processing (ICIP) - Face image assessment learned with objective and relative face image qualities for improved face recognition

Kim, Hyung-Il, Lee, Seung Ho, Ro, Yong Man
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Year:
2015
Language:
english
DOI:
10.1109/ICIP.2015.7351562
File:
PDF, 1.01 MB
english, 2015
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