[IEEE 2015 IEEE International Conference on Image Processing (ICIP) - Quebec City, QC, Canada (2015.9.27-2015.9.30)] 2015 IEEE International Conference on Image Processing (ICIP) - Face image assessment learned with objective and relative face image qualities for improved face recognition
Kim, Hyung-Il, Lee, Seung Ho, Ro, Yong ManYear:
2015
Language:
english
DOI:
10.1109/ICIP.2015.7351562
File:
PDF, 1.01 MB
english, 2015