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SPIE Proceedings [SPIE OE/LASE'93: Optics, Electro-Optics, & Laser Applications in Science& Engineering - Los Angeles, CA (Sunday 17 January 1993)] Lasers and Optics for Surface Analysis - Laser ablation/ionization analysis of trace impurities from bulk materials
Alimpiev, Sergey S., Belov, M. E., Nikiforov, Sergey M., de Vries, Mattanjah S.Volume:
1857
Year:
1993
Language:
english
DOI:
10.1117/12.148511
File:
PDF, 570 KB
english, 1993