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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Applications of Digital Image Processing XXXVIII - Research of improved sparse grid non-uniformity correction technologies for infrared resistor array
Tescher, Andrew G., Du, Hui-jie, Zhao, Hong-ming, Gao, Yang, Yu, Hong, Zhang, YiVolume:
9599
Year:
2015
Language:
english
DOI:
10.1117/12.2186547
File:
PDF, 581 KB
english, 2015