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SPIE Proceedings [SPIE Intelligent Systems and Smart Manufacturing - Boston, MA (Sunday 5 November 2000)] Process Imaging for Automatic Control - Processing data from scanning gauges: 2D reconstruction
Duncan, Stephen R., Wellstead, Peter E., McCann, Hugh, Scott, David M.Volume:
4188
Year:
2001
Language:
english
DOI:
10.1117/12.417180
File:
PDF, 188 KB
english, 2001