Experimental Reliability Improvement of Power Devices...

IEEE Electron Device Letters 2015 / 7 Vol. 36; Iss. 7

Experimental Reliability Improvement of Power Devices Operated Under Fast Thermal Cycling

Simon, Dan, Boianceanu, Cristian, De Mey, Gilbert, Topa, Vasile
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Volume:
36
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2015.2432128
Date:
July, 2015
File:
PDF, 1.64 MB
english, 2015
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