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[IEEE 2014 29th Symposium on Microelectronics Technology and Devices (SBMicro) - Aracaju, Brazil (2014.9.1-2014.9.5)] 2014 29th Symposium on Microelectronics Technology and Devices (SBMicro) - Temperature and back-gate bias influence on the operation of lateral SOI PIN photodiodes
Novo, Carla, Giacomini, Renato, Doria, Rodrigo T., Afzalian, Aryan, Flandre, DenisYear:
2014
Language:
english
DOI:
10.1109/sbmicro.2014.6940097
File:
PDF, 1.99 MB
english, 2014