[IEEE Proceedings of 35th European Solid-State Device...

[IEEE Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. - Grenoble, France (12-16 Sept. 2005)] Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. - Influence of ballistic and pocket effects on electron mobility in si MOSFETs

Lusakowski, J., Knap, W., Meziani, Y., Cesso, J.-P., El Fatimy, A., Tauk, R., Dyakonova, N., Ghibaudo, G., Boeuf, F., Skotnicki, T.

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Year:

2005

Language:

english

DOI:

10.1109/ESSDER.2005.1546710

File:

PDF, 217 KB

english, 2005

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