[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Low cost at-speed testing using On-Product Clock Generation compatible with test compression
Keller, B., Chakravadhanula, K., Foutz, B., Chickermane, V., Malneedi, R., Snethen, T., Iyengar, V., Lackey, D., Grise, G.Year:
2010
Language:
english
DOI:
10.1109/TEST.2010.5699276
File:
PDF, 1.89 MB
english, 2010