Integrity evaluation of SiOx film on polyethylene...

NDT & E International 1996 Vol. 29; Iss. 5

Integrity evaluation of SiOx film on polyethylene terapthalate by AE characterization and laser microscopy

Takashi Futatsugi, Shingo Ogawa, Mikio Takemoto, Masa-aki Yanaka, Yusuke Tsukahara
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Volume:
29
Year:
1996
Language:
english
Pages:
10
DOI:
10.1016/s0963-8695(96)00034-5
File:
PDF, 1017 KB
english, 1996
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